0102030405
Integrated Ultrasonic Scanning Microscope-special For Diamond
Application
It can be applied to on-site sampling and testing of small and medium-sized parts in the workshop, or in the physical and chemical testing laboratory.
Failure analysis is widely used in welding/packaging process improvement, material analysis, etc.
Main configuration
Cantilever three-axis motion table, fully enclosed protection, universal fixture, one-key calibration, remote assist, automatic water loading and unloading and water circulation purification system.
Product Specification
| Model | NYTS110 |
| Maximum scanning range | 350mm×200mmx110mm |
| Machine size | 1.35mx0.95mx0.13m |
| Typical scanning time | < 65s (Test conditions: 10mm×10mm scan area; Resolution: 50um) |
| Maximum scanning acceleration | 0.8m/s2 |
| Recommended image resolution | 0.5um~4000um |
| Power supply | 220V/50Hz, 2KW |
| Sampling frequency | 25~250MHz; Standard, upgradable to 1.5GHz; |
| Maximum scanning speed | 300mm/s |
| Positioning accuracy of the motion table | +0.5um in the X/Y direction, 10um in the Z direction |
| Repeat positioning accuracy | X/Y ≤+0.01mm, Z ≤+0.02mm |
| Probe frequency range | 1~50MHz; (Standard, upgradable to 230MHz) |
| Adjustable gain per channel | - 13~66dB; (Standard, upgradeable) |
| Pulse repetition rate | 5kHz; (Standard, upgradeable) |
Application Case
Basic Functions
